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MIMOS WAFER & IC TESTING LAB

MIMOS BERHAD MALAYSIA
  • 4072 Auto Parametric Test System
  • 4073 Auto Parametric Test System
  • 4082A Auto Parametric Test System
  • Analog/Mixed-Signal Test Sytem
  • Functional Test System (Microcontroller and Consumer ICs)
  • Plasma Damage and Hot Carrier Injection (HCI Degradation) Test System (Automatic)
  • Mobile Ionic Contamination (MIC), Electromigration, CV Measurement and Gate Oxide Integrity
  • Test System (Manual)
  • Device Modelling and Simulation for Device & IC Design (BSIM3v3)
  • Interconnect Parasitics Modelling
  • Keithley CV System
  • Keithley IV System
  • HP IV System
  • Backgrinding System
  • Standalone Tools JMP and Minitab Statistical Analysis Software
  • Integrated Data Analysis 

For any enquiries, contact our Administrator

Level 19, MoF Inc. Tower,
9, Persiaran KLCC,
50088 Kuala Lumpur,
Malaysia

+603-86558750

i-ogse@mprc.gov.my

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