MIMOS FAILURE ANALYSIS , MATERIAL ANALYSIS & NANO

2D X-Ray + 3D X-Ray 

Curve Tracer (Logic + High Voltage + High Current)

Photon Emission Microscope (PEM)

Optical Beam Induced Resistance Change (OBIRCH)

Thermal Emission Microscope (Thermal IR)

Hall Effect 

Laser & Chemical Decapsulator 

Ion Milling / Polishing

Mechanical Polishing

Precision Etching Coating System (PECS)

Scanning Probe Microscopy (SPM) 

Macroindenter + Nanoindenter + SPM 

Stylus Profilometer

Confocal & Digital Microscope

Atomic Force Microscope (AFM) – Electrical, Conductive, Magnetic, Liquid 

Energy Dispersive Spectrometer (EDS) 

Electron Backscattered Diffraction (EBSD) 

Wavelength Dispersive Spectroscopy (WDS) 

Electron Energy Loss Spectroscopy (EELS) 

Scanning Transmission Electron Microscope (STEM) 

Cathodoluminescence Microscope (CL) 

FEG-Scanning Electron Microscopy (FESEM) + EDS 

Variable Pressure FEG-Scanning Electron Microscope  (VP-FESEM)  + STEM + CL + EDS + EBSD + WDX 

Dual Beam (FIB+FESEM) + EDS + STEM 

Transmission Electron Microscope (TEM) + STEM + EDS + EELS 

Cryo Ultramicrotome 

Auger Electron Spectroscopy (AES) – Depth Profiling, Mapping

Time-of-Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) – Depth Profiling, Mapping

X-Ray Photoelectron Spectroscopy (XPS) – Depth Profiling, Mapping

Reflection Electron Energy Loss Spectroscopy (REELS)

Ion Scattering Spectroscopy (ISS) 

Ultraviolet Photoelectron Spectroscopy (UPS)

X-Ray Photoelectron Spectroscopy (XPS) + REELS + ISS + UPS

RAMAN Spectroscopy – UV, PL, Blue, Red, Green

Fourier Transform Infrared Spectroscopy (FTIR) – MicroATR, Mapping (FPA) 

Ultraviolet-Visible-Near Infrared Spectroscopy (UV-Vis-NIR)