- 4072 Auto Parametric Test System
- 4073 Auto Parametric Test System
- 4082A Auto Parametric Test System
- Analog/Mixed-Signal Test Sytem
- Functional Test System (Microcontroller and Consumer ICs)
- Plasma Damage and Hot Carrier Injection (HCI Degradation) Test System (Automatic)
- Mobile Ionic Contamination (MIC), Electromigration, CV Measurement and Gate Oxide Integrity
- Test System (Manual)
- Device Modelling and Simulation for Device & IC Design (BSIM3v3)
- Interconnect Parasitics Modelling
- Keithley CV System
- Keithley IV System
- HP IV System
- Backgrinding System
- Standalone Tools JMP and Minitab Statistical Analysis Software
- Integrated Data Analysis